第三代
半导体测试家族
Third generation semiconductor testing family
分类
QT-3105 TRR diode reverse recovery test
Self-developed LCR digital bridge supports Mosfet RG/CG test and can also be used to test the capacitance of diodes, with a resolution of 1fF
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Independent programmable power supply |
Support double DIE |
Dual channel test |
Waveform display |
| Type | QT-3105TRR |
| Advantages | Supports dual-core TRR parameter testing, equipped with VRR voltage probe |
| Main Features |
? Output capability IF 100A VR 1KV di/dt>1000A Measurement resolution 0.1ns |
Recommend推荐产品
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中国广东省佛山市南海国家高新区新光源产业基地光明大道16号 |
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0757 83207313 (销售) |
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0757 83208786 (销售) |
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info@powertechsemi.com |
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